Testing of Analog Parts of Electronic Embedded Systems with Limited Access to Internal Nodes
نویسنده
چکیده
A new class of multi-port methods based on extension of input-output two-port methods of soft fault diagnosis of passive elements in analog circuits is presented. It uses accessible internal nodes of the tested analog circuit for additional measurements of circuit time responses. Thanks to this, the fault resolution increases, that is we obtain better fault localization coverage.
منابع مشابه
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